The lead article looks at TCAD as a key component of Design for Manufacturing (DFM). This is followed by articles on the calibration work of the Consulting and Engineering Group, the impact of structure representation on the extraction of interconnect capacitance, the 3D modeling of stress history, and the 3D process and device simulations of a 25-nm NMOS Omega FinFET.
Please fill out the registration form to download a PDF of this TCAD Newsletter issue.
Please register with your official email ID (company or university). Other commercial email IDs (yahoo, gmail, etc.) will not be accepted.