Test SIG Event at ITC 2013 

Higher Quality, Lower Cost. Faster. 

At Synopsys' Special Interest Group (SIG) event at ITC 2013, Test experts from Synopsys and STMicroelectronics introduced new Synopsys test technologies, DFTMAX Ultra and DesignWare STAR Hierarchical System. In these videos, you will learn why and how leading companies are deploying these technologies to boost compression, significantly lower test costs and improve turnaround time implementing hierarchical test for large SoCs and IP.

 
Introducing DFTMAX Ultra
Learn about the new features in DFTMAX Ultra that enable 2-3X higher compression, support faster scan chains and require fewer pins.
Rohit Kapur, Scientist, Synopsys
 Insights on DFTMAX Ultra
Hear about STMicroelectronics' experience using DFTMAX Ultra.
Swapnil Bahl, SoC Test and Diagnosis Team Lead, STMicroelectronics
 
Introducing DesignWare STAR Hierarchical System
Learn about the new features in DesignWare STAR Hierarchical System that reduce integration time, optimize overall test time, re-use of IP/core-level patterns and deliver faster production ramp.
Yervant Zorian, Fellow and Chief Architect, Synopsys
  



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