Overview
Proteus Progen, and Prospector form a comprehensive and powerful environment for performing full-chip proximity correction, building models for correction, and analyzing proximity effects on corrected and uncorrected IC layout patterns. The high level of programmability and flexibility built into these tools ensures an optimal match to your processing objectives and constraints.
Proteus, the core correction processing engine, combines an efficient hierarchy
manager with proprietary, high-speed simulation algorithms. Proteus is typically
parallelized across clusters of computers resulting in reliable, accurate full-chip
corrections and compact output files with fast turn-around time.
- Progen, a revolutionary lithography model development tool, enables users to create models of virtually any form and fit them to empirical data. The results are compact, efficient models used by the Proteus correction engine.
- Prospector, an interactive visualization and analysis tool through which the interactions of models and patterns can be explored, measured, collated and exported for use by other tools.
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Original pattern
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Moderate correction
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Aggressive correction
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Notching effect correction.
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Selective correction.
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Proteus Correction Processor
Optical Proximity Correction (OPC) plays
an increasingly critical role in enabling
optical lithography to keep pace with
shrinking chip dimensions. Proteus
enhances yield and enables the continued
evolution toward ultra deep sub-micron
designs by modifying layout geometries for
systematic distortions introduced during
fabrication. Extensive programmability
ensures that Proteus can be adapted to
accommodate virtually any type of optical
proximity effect or other distortions arising
from resist, etch and underlying topography
influences.
Programmable Correction Fidelity
In two dimensional configurations, a perfect
correction would require continuously
varying biases on features. To address
trade-offs between correction fidelity and
mask fabrication constraints, such as
pattern grid and file size, the user is
provided a number of options to control
correction aggressiveness, granularity and
tolerance. Treatments applied to corners,
line-ends and other two-dimensional
structures can be fully customized with the
recipe control scripting language.
Multiple Layer Handling
Corrections involving influences from
several masking layers can be handled in a
number of ways. One method is to use
figures in reference layers to select regions
to correct. In advanced applications,
reference levels can be used to model
underlying topography for substrate-based
correction.
Distributed Processing
Proteus supports distributed network
processing for fast turn-around time.
By distributing the task among several
platforms, cycle times can be shortened
to meet your requirements. Excellent
scalability has been achieved on more
than 100 processors.

Correction applied to pattern by modifying existing geometries
and adding non-printing auxiliary features.
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Design rules can be checked during correction.
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Correction jobs are controlled via a straightforward user
interface. (click to view larger image)
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Engineered Mask Techniques
Proteus offers extensive support for a
variety of engineered mask techniques.
Auxiliary features can be placed in the
corrected pattern using the recipe scripting
language. These can be used as subresolution
assist features, for customized
serif or end-cap shapes, or for loadbalancing
applications.
Proteus also supports corrections for many
phase-shift mask (PSM) strategies.
Correction can simultaneously modify
phase and chrome masking layers.
Flexible User Interface
Several layers of programmability provide
Proteus users the maximum degree of
control over all aspects of the correction
process, while at the same time preserving
a simple user interface. In-depth recipe
customization can be performed by directly
modifying the recipe scripts. The recipe
scripting language is linked to a
configurable graphical user interface so
that recipes and user-customized scripts
can present a concise set of controls to
non-expert users.
Design Rule Conformance
Mask design rules can be checked during
correction to ensure that corrected mask
patterns meet your mask fabrication
requirements.
Correction applied to pattern by modifying
existing geometries and adding non-printing
auxiliary features. United States Patent
Numbers 5,242,770 and 5,447,810 claim
certain aspects of the use of Auxiliary
Features to address proximity effects and
depth of focus issues. The patents are
assigned to ASML MaskTools, Inc. and, as
with all patents, are presumed valid
pursuant to U.S.C. $ 282.
Progen - Model Development Tool

ProGen provides automated tools for fitting models to empirical data. (click to view larger image)
Progen builds the behavior models used by
the OPC engine for proximity correction and
by Prospector for lithography simulation.
Progen's integrated environment supports:
- The IC community's commonly used
empirical model forms.
- A framework for defining and testing new
model forms using a general model
expression language.
- Spreadsheet-like data management for
defining an empirical test suite and
modeling all test point configurations
automatically.
- Regression tools that optimize model
parameters to fit empirical data using
user-defined cost functions.
- Visualization and plotting tools for direct
analysis of model characteristics, CD
behaviors and statistical fits.
- Conversion of models to a
compact, efficient representation
for seamless transfer to other
Synopsys Mask Synthesis tools.
Prospector - Visualization and Analysis

ProGen models are defined using easy-to-read templates. (click to view larger image)

(click to view larger image)
Prospector is an interactive
simulation and analysis tool that is
closely integrated with the other
OPC modules. High-speed wafer
image simulation, based on Progen
models, supports many proximity
effect visualization and analysis
functions. Prospector interactively
provides qualitative and quantitative
information on wafer imaging
characteristics under alternative
recipe parameter and process
conditions.
Prospector Helps You:
Visualize and quantify wafer proximity
effects with interactive simulation,
including contour generation, intensity
field display, and programmable
measurement and plotting functions.
Quickly analyze and optimize correction
recipes by directly linking to the
correction processor.
Easily create automated experiments
involving large numbers of measurement
sites and model conditions with batched
assessments and with a macro record
and save feature.
Interactively create and manipulate layout
patterns to explore advanced OPC,
PSM and other wavefront engineering
techniques.
Optimize process conditions for OPC by
simultaneously evaluating and comparing
OPC performance under different model
conditions.
Proteus, Progen, Prospector Specifications
Configuration
- Recommended RAM: 512MB
- Recommended Disk: 2GB
- Recommended Swap: 1GB
Platforms
- UltraSparc: Sun Solaris 2.5 or higher
- HP-PA: HP-UX 11.0
- IA32: Linux RedHat 7.2*
*Proteus only
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