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Test Webinar

Boosting Yield and Increasing Quality with Power-Aware Test and Small Delay Defect Testing

Overview
During this FREE technical webinar, we will provide an overview of new capabilities in DFTMAX™ compression and TetraMAX® ATPG that manage device power consumption at the tester, resulting in higher yield. Also, we will review technology developed at Synopsys that can help you create tests to detect defects creating small delays, thereby increasing your manufacturing test quality.

Who should attend: DFT Engineers, Design Engineers and Engineering Managers

Estimated duration: 50 minutes
Please email event-related questions to: TestInfo@synopsys.com

Please complete the following registration form.

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