Virtual Prototyping
Accelerate pre-RTL embedded software development, hardware/software integration, and system validation
Architecture Design
Quickly explore tradeoffs in your SoC architecture to achieve optimal product performance and cost to avoid over- or under-design
FPGA-Based Prototyping
Accelerate the creation of your ASIC prototype with a high-speed hardware prototyping environment including a comprehensive software flow
Core Optimization
Differentiate your product with the right combination of performance, power and area for your most design-critical cores
Design Flow Deployment
Optimize your design flow to address the latest design challenges
Physical Design Assistance
Leverage our tape-out proven flows and project experience to implement your very-deep submicron chip
IP Integration & SoC Verification
Get to market faster and reduce SoC design and verification cost by applying best practices in RTL creation and functional verification
This issue has two articles; the first discusses the latest TCAD models for simulating negative bias temperature instability, which impacts PMOS device reliability. The second article reviews the effect of hot carriers in semiconductor device operation and reliability, and illustrates the combination of hot-carrier energy and degradation models in simulating channel-initiated secondary-electron (CHISEL) current in flash memory cells.
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