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Oct 28, 2009
NVIDIA Adopts Synopsys Yield Explorer to Reduce Time to Volume
Design-centric yield management enables product engineers to achieve rapid yield ramp and provide cost-effective yield control in volume production
Mar 16, 2009
Synopsys Announces Yield Explorer – Design-Centric Yield Management for Product Engineering Teams
Yield Explorer Demonstrates 10x Faster Volume Diagnostics Analysis with a Single Data-Bank for Design, Fab and Test Data to Identify the Source of Yield Loss
SPIE ADVANCED LITHO
Visit us at Booth #420 – Feb 12-16
San Jose, CA
Webinar
Using TetraMAX and Yield
Explorer for Rapid Failure Analysis
VIDEO INTERVIEW
Yield Metrology Looking at Systematic Failure
NEW WAFER FOCUS
Fall 2011 - Latest issue now available!
News
NVIDIA Adopts Synopsys Yield Explorer to Reduce Time to Volume
Synopsys Announces Yield Explorer – Design-Centric Yield Management for Product....
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All Synopsys News
Articles
EDN: Design-centric yield management
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Yield Explorer Datasheet
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Success Stories
Photronics Relies on Synopsys for Photomask Manufacturing Solutions
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Webinars
New Features & Updates: Sentaurus TCAD (H-2013.03)
Foundry-Fabless Collaboration Achieves Higher Yield, Faster Ramp
TetraMAX and Yield Explorer for Rapid Failure Analysis
Lithography Verification on Advanced Nodes with Proteus
Volume Diagnostics for Yield Ramp at Nanometer Nodes
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Wafer Focus, Summer 2012
CATS News, Spring 2012
Wafer Focus, Fall 2011
CATS News, Spring 2011
Wafer Focus, Fall 2010
Wafer Focus, Spring 2010
CATS News, Spring 2010
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