Yield Explorer Datasheet
Yield Explorer brings yield relevant data from diverse sources such as the physical design flow, wafer manufacturing, and wafer and chip level testing into a single data bank. With the widest possible range of data at their disposal, users achieve unsurpassed clarity in root cause analysis when faced with systematic yield limiters. Yield Explorer achieves this with an order of magnitude advantage in analysis speed in the most complex of use cases - for example, 10X faster volume diagnostics analysis of ATPG output.