Today’s demanding applications require silicon technologies to take up less space while delivering more functionality with lower power. In addition, the combination of shrinking process technologies and increasing design complexity makes it more difficult to achieve high yield, so a robust memory repair solution is critical for achieving superior test quality and high manufacturing yield.
Synopsys' DesignWare® Embedded Memory and Logic Library portfolio offers the largest selection of silicon-proven, low-risk, easy-to-integrate memory and logic IP available today. The High Performance Core (HPC) Design Kit contains a suite of high-speed and high-density memory instances and logic cells specifically designed to enable SoC designers to optimize their CPU, GPU and DSP cores for maximum speed, smallest area, lowest power or an optimum balance of all three. In addition, the DesignWare STAR Memory System® provides an integrated built-in self-test (BIST) and repair solution that improves test quality and manufacturing yield, while the DesignWare STAR Hierarchical System automates hierarchical testing for analog/mixed-signal IP, digital logic blocks and interface IP on an SoC. Synopsys’ comprehensive solution of embedded memories, test and logic libraries gives you everything you need to implement a full SoC and achieve the best combination of power, performance, area and yield.