Reliability and Qualification of MTP NVM IP from Commercial to Automotive Applications
Multi-time programmable (MTP) non-volatile memory (NVM) is embedded in a wide range of applications including battery management ICs for mobile devices, security and encryption SoCs for content protection, MEMS and sensors, and RF / wireless applications. One of the keys to successfully ramping to production with MTP NVM IP technology is the silicon testing and qualification.
- This webinar will focus on three topics:
Review the overall strategy for releasing MTP NVM IP into production including manufacturability, reliability, and monitoring considerations
- Compare and contrast the applicable industry standards for qualifying embedded MTP NVM IP, including qualification for commercial and automotive grade products
- Understand how Synopsys designs and executes on a silicon testing methodology for embedded MTP NVM IP technology, enabling SoC designers with reliable and qualified solutions for their end applications
Who should attend: Analog IC designers, SoC design engineers, managers and system architects
Length: 45 minutes
Webinar Date: October 5, 2011
Presenter: Martin Niset, Senior Product and Test Engineering Manager, Synopsys
Martin Niset is Senior Product and Test Engineering Manager for the NVM IP product line at Synopsys. Prior to joining Synopsys, Martin managed all the silicon testing and qualification activities for the NVM product lines at Virage Logic and Impinj. Martin has over 10 years of experience working with embedded NVM including automotive grade embedded Flash technology while at Freescale. Martin holds a Engineering in Physics BS from the Université Libre de Bruxelles, and a Mechanical Engineering MS from the University of Texas, Austin.