Alessandro Valerio, STMicroelectronics
Charles Odinot, STMicroelectronics
Christelle Leherpeur, STMicroelectronics
Christophe Scarabello, Tiempo SAS
Claus Kuntzsch, University of Applied Sciences Nuremberg
David Long, Doulos
David Tester, Structured Custom Ltd.
Didier Maurer, Dolphin Integration
Evagelia Diamantakou, Intracom
François Cerisier, Test and Verification Solutions Ltd.
Farid Labib, LSI Corporation
Herbert Preuthen, LSI Corporation
Herbert Taucher, Siemens AG Austria
Jonathan Bromley, Verilab
Karsten Matt, GLOBALFOUNDRIES
Kousalya Nagakarthick, LSI Corporation
|
Laurent Besson, ST-Ericsson
Majid Ghameshlu, Siemens AG Austria
Mark Wilmott, STFC Rutherford Appleton Laboratory
Norbert Schuhmann, Fraunhofer Institute for IC
Richard Illman, Dialog Semiconductor
Robert Fairlie, Verilab
Robert Siegmund, GLOBALFOUNDRIES
Shalom Bresticker, Intel
Stuart Riches, ARM
Stuart Vernon, Imagination Technologies
Sylvie Pierunek, STMicroelectronics
Tarun Chawla, STMicroelectronics
Thomas Haase, Renesas
Touqeer Azam, CSR
Tobias Thiel, Freescale Semiconductor
Tiana Rahaga, Ulis
|