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Ajay Bavle Microchip Technology Al Czamara, Test Evolution Alex Tetelbaum, Abelite Design Automation Andy Copperhall, ARCH Design Anwar Hasan, STMicroelectronics Avishek Panigrahi, Xilinx Brian Kane, Northrop Grumman Corp. Chris Kiegle, IBM Cliff Cummings, Sunburst Design, Inc. David Flynn, ARM Don Mills, Microchip Technology Frank Szorc, Linear Technology John Dickol, Samsung John Wei, Alchip Jonah Probell, Consultant Karthik Rajan, Microchip Technology Krishna Vittala, Microchip Technology |
Leah Clark, Broadcom Corp. Mark Sprague, AMD Mike Bartley, Test Verification and Solutions Neil Johnson, XtremeEDA Paul Lungu, Ciena Paul Zimmer, Zimmer Design Services Priyank Parakh, AMD Raj Varada, Intel Corp. Rick Furtner, Consultant Ron Goodstein, First Shot Logic Simulation & Design Ronald Kalim, Consultant Sachin Parikh, Broadcom Corp. Stu Sutherland, HDL Sutherland Tom Mahatdejkul, ARM Victoria Kolesov, Intel Corp. Zafar Hasan, NVIDIA |