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SNUG Austin 

Hyatt Regency Austin 

Austin, TX
September 28, 2012


SNUG Austin is your opportunity to learn, share and engage with your fellow Synopsys technology users. In addition to an exceptional technical program that will give you practical information you can apply to your current project or use to jump-start your next design, SNUG also offers plenty of opportunities to share experiences, network with other users and meet with Synopsys experts to learn about the newest products and preview future technology direction.

 

SNUG Austin Proceedings
Check out the SNUG Austin proceedings library to locate user papers or tutorials that contain solutions you can apply to your own design challenges.


1st Place - Best Paper Fault Grading via TetraMAX
Anirudh Kadiyala, Vibhor Mittal, Atchyuth Gorti, Roystein Oliveira, Amit Pandey [Advanced Micro Devices, Inc.]
PaperPresentation


2nd Place - Best Paper DFTMAX and TetraMAX Adoption on AMD’s Bobcat Core
Shaishav Parikh, Vance Threatt and Andy Halliday [Advanced Micro Devices, Inc]; Glenn Boyer, Lori Schramm [Synopsys, Inc.]
PaperPresentation


3rd Place - Best Paper Technical Committee Award Honorable Mention Advanced Design Closure Techniques Using IC Compiler and Zroute on High Performance Designs at 32nm and Below
Hongda Lu, Hyon Han, Yu-Ming Chiang [Advanced Micro Devices, Inc.]
PaperPresentation


ProceedingsDownload 2011 proceedings
PAPERS (18 MB) PRESENTATIONS (13 MB) TUTORIALS (16 MB)

SNUG thanks the members of the Technical Committee who volunteer their time and expertise to ensure SNUG’s technical quality, local perspective and value to the users of Synopsys tools and technology.

User Technical Chairperson
Jay Wasserman, Analog Devices, Inc.

Members
Al Czamara, Test Evolution
Al Conti, The MITRE Corp.
Alex Tetelbaum, LSI
Andy Copperhall, Consultant
Avishek Panigrahi, Xilinx
Brian Kane, Northrop Grumman Corp.
Chris Kiegle, IBM
Dinesh Tyagi, Innovative Logic Inc.
Don Mills, LCDM Engineering
Frank Szorc, Linear Technology
Heath Chambers, HMC Design Verification, Inc.
John Dickol, Samsung
John Wei, Alchip Technologies
Jonathan Wolfe, Samsung
Jonah Probell, Arteris
Leah Clark, Broadcom Corp.
Mark Sprague, AMD
Mike Bartley, Test and Verification Solutions, Ltd.
Neel Das, SMSC
Paul Stein, Dept of Defense
Priyank Parakh, AMD
Rich Burgess, AMD
Rick Furtner, Consultant
Ron Goodstein, First Shot Logic Simulation and Design
Ronald Kalim, Consultant