TSMC/Synopsys CustomSim Collaboration for 16nm FinFET Design Success
Join TSMC and Synopsys as we discuss N16FF+/early N10 certification collaboration activities and how CustomSim 2015.06 addresses the design needs of FinFET technology nodes.
Jacob Ou, Technical Manager, TSMC; Tom Hsieh, Corporate Application Engineering Manager, Synopsys
Aug 12, 2015
HSPICE Tips & Tricks Webisode Series
Learn from Synopsys applications engineers how to get the most out of HSPICE analysis. Topics will include how to most effectively use S-element, eye diagrams, IBIS-AMI, RUNLVL, and more. New mini webinars will premiere monthly.
Ted Mido, Principal Engineer, HSPICE R&D, Synopsys
Nov 03, 2014
VCS AMS for Advanced SoC Mixed-signal Verification
Learn how ARM and STMicroelectronics are using the advanced verification techniques and productivity features of VCS AMS to verify their mixed-signal SoC designs.
Helene Thibieroz, VCS AMS Product Marketing Manager, Synopsys, Inc.; Pierluigi Daglio, AMS Design Verification Flows Manager, STMicroelectronics; Venkatesh Bharanthi Krishnamurthy, Manager of Design Automation, ARM
Sep 03, 2014
Advanced Mixed-Signal Design and Verification of Smartcar ICs
In this webinar, Micronas and Synopsys discuss the breadth of automotive IC applications, challenges in design implementation and verification and the solutions that stemmed from their collaboration.
Mario Anton, Micronas; Gernot Koch, Micronas; Marco Casale-Rossi, Synopsys
Jul 31, 2014
Advanced-Node Variability Characterization and STA Margining with SiliconSmart and PrimeTime
Learn about the new slew-/load-dependent POCV delay model, and hear GLOBALFOUNDRIES describe their experiences using SiliconSmart and PrimeTime to implement a variation-based methodology for advanced
Dr. Tamer Ragheb, SMTS Design CAD Engineer, GLOBALFOUNDRIES; Moninder Bansal, Senior Manager, Corporate Applications Engineering, Synopsys
Jun 11, 2014
FineSim Technology for Analog and Full-Chip Simulation - A Micron Case Study
Learn about FineSim’s transient analysis advantage and the rich feature set that that combines SPICE and FastSPICE simulation technology in one single environment used for memory design at Micron.
Raed Sabbah, Sr. Design Engineer, Embedded Solutions Group, Micron Technology
May 08, 2014
Discovery-AMS for Mixed-Signal Verification - An ST-Ericsson Case Study
ST-Ericsson shares details on how they leveraged new Discovery-AMS multi-core technology to improve their overall verification flow.
Francois Ravatin, AMS Verification Engineer, ST-Ericsson; Helene Thibieroz, Sr. Product Marketing Manager, Synopsys
May 21, 2013
Open Your Eye with HSPICE Fast and Accurate Eye Diagram Analysis
Learn how HSPICE can help you quickly model high-frequency channel components, run fast transient with long cable S-parameter models, and accurately analyze eye measurement.
Ted Mido, Sr. Staff R&D Enigeer, Synopsys
Oct 17, 2012